Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships
Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships
复制标题
串行块面扫描电子显微镜与双轴电子束断层扫描相结合，为细胞关系提供了新的见解
DOI：
10.1093/jmicro/dfs069
复制
发表时间：
2013
期刊：
影响因子：
--
通讯作者：
Tohyama K
中科院分区：
文献类型：
--
作者：
Sawai T;Kamataki A;Uzuki M;Ishida K;Hanasaka T;Ochi K;Hashimoto T;Kubo T;Morikawa A;Ochi T;Tohyama K
为了评估串行块面扫描电子显微镜和双轴电子束断层扫描这两种先进电子显微镜技术相结合的优势，我们使用组合方法分析了类风湿性关节炎患者滑膜中树突状细胞和浆细胞之间细胞关系的三维形态。
To evaluate the advantages of combination of two advanced electron microscopic technologies such as serial block-face scanning electron microscopy and double-axis electron beam tomography, we analyzed the three-dimensional morphology of cellular relationships between dendritic and plasma cells in the synovial membrane from patients with rheumatoid arthritis, using the combined approach.