Array Design of High-Density Emerging Memories Making Clamped Bit-Line Sense Amplifier Compatible with Dummy Cell Average Read Scheme

Array Design of High-Density Emerging Memories Making Clamped Bit-Line Sense Amplifier Compatible with Dummy Cell Average Read Scheme
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高密度新兴存储器的阵列设计使钳位位线读出放大器与虚拟单元平均读取方案兼容

DOI:
10.1587/transele.2019ecp5039
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发表时间:
2020
影响因子:
0.5
通讯作者:
Takashi OHSAWA
Takashi OHSAWA
中科院分区:
工程技术4区
文献类型:
--
作者:
Ziyue ZHANG;Takashi OHSAWA

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