Self-biased dielectric bolometer from epitaxially grown Pb(Zr,Ti)O3 and lanthanum-doped Pb(Zr,Ti)O3 multilayered thin films
Self-biased dielectric bolometer from epitaxially grown Pb(Zr,Ti)O3 and lanthanum-doped Pb(Zr,Ti)O3 multilayered thin films
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由外延生长的 Pb(Zr,Ti)O3 和掺镧 Pb(Zr,Ti)O3 多层薄膜制成的自偏置介电辐射热计
DOI：
10.1063/1.1289064
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发表时间：
2000
影响因子：
4
通讯作者：
Weiguang Zhu
中科院分区：
文献类型：
--
作者：
Weiguo Liu;B. Jiang;Weiguang Zhu
采用溶胶-凝胶法制备了外延生长的锆钛酸铅Pb1.1(Zr0.3Ti0.7)O3 （pzt30 /70）和掺杂镧的锆钛酸铅Pb0.83La0.17(Zr0.3Ti0.7) 0.95750 O3 （plzt17 /30/70）多层薄膜，实现了自偏置介质测热计。高分辨率透射电镜图像和电子衍射图表明，多层膜具有优选（111）取向，外延生长在pzt30 /70和plzt17 /30/70层之间。在PLZT 17/30/70相变温度为120℃时，在无外部偏置的预极化样品中观察到自偏置现象和较大的热释电电流。在120℃左右，多层薄膜的热释电系数高达990 μC/m2K。PLZT 17/30/70层明显存在诱导极化。我们将这种自偏置效应归因于直接接触的四边形pzt30 /70层中强烈的残余极化。
A self-biased dielectric bolometer has been realized by epitaxially grown lead zirconate titanate Pb1.1(Zr0.3Ti0.7)O3 (PZT 30/70) and lanthanum-doped lead zirconate titanate Pb0.83La0.17(Zr0.3Ti0.7)0.9575O3 (PLZT 17/30/70) multilayered thin films using the sol-gel technique. The high-resolution transmission electron microscopy images and electron diffraction pattern showed that the multilayered film had its preferred (111) orientation and the epitaxial growth between the PZT 30/70 and PLZT 17/30/70 layers. The self-biased phenomenon and a large pyroelectric current were observed in the prepoled sample without any external bias at the PLZT 17/30/70 phase transition temperature of 120 °C. Pyroelectric coefficient as high as 990 μC/m2K is obtained in the multilayer thin films around 120 °C. It is obvious that there exists an induced polarization in the PLZT 17/30/70 layer. We attribute this self-biased effect to the strong remnant polarization in the immediately contacted tetragonal PZT 30/70 layers.