Quantum microscopy based on Hong-Ou-Mandel interference
Quantum microscopy based on Hong-Ou-Mandel interference
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DOI：
10.1038/s41566-022-00980-6
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发表时间：
2022-04-11
期刊：
影响因子：
35
通讯作者：
Faccio, Daniele
中科院分区：
文献类型：
--
作者：
Ndagano, Bienvenu;Defienne, Hugo;Faccio, Daniele
Hong-Ou-Mandel（HOM）干涉-分束器中不可分辨光子的聚束-是量子光学的主要内容，也是许多量子传感方法和最新光量子计算机的核心。在这里，我们报告了一个全场，无扫描的量子成像技术，利用HOM干涉重建透明样品的表面深度分布。我们证明了检索图像的能力与微米级的深度功能与光子通量小到每帧7个光子对。使用单光子雪崩二极管相机，我们测量在HOM干涉仪的输出处的聚束和反聚束光子对分布，其被组合以提供样品的低噪声图像。这种方法证明了HOM显微镜作为一种工具的透明样品在非常低的光子region.Hong-Ou-Mandel干涉的无标记成像的可能性，使深度分辨量子成像在非常低的光水平。
Hong-Ou-Mandel (HOM) interference-the bunching of indistinguishable photons at a beamsplitter-is a staple of quantum optics and lies at the heart of many quantum sensing approaches and recent optical quantum computers. Here we report a full-field, scan-free quantum imaging technique that exploits HOM interference to reconstruct the surface depth profile of transparent samples. We demonstrate the ability to retrieve images with micrometre-scale depth features with photon flux as small as seven photon pairs per frame. Using a single-photon avalanche diode camera, we measure both bunched and anti-bunched photon-pair distributions at the output of an HOM interferometer, which are combined to provide a lower-noise image of the sample. This approach demonstrates the possibility of HOM microscopy as a tool for the label-free imaging of transparent samples in the very low photon regime.Hong-Ou-Mandel interference enables depth-resolved quantum imaging at very low light levels.