Likelihood-based structural analysis of electron microscopy images
Likelihood-based structural analysis of electron microscopy images
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DOI：
10.1016/j.sbi.2018.03.004
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发表时间：
2018-04-01
影响因子：
6.8
通讯作者：
Hummer, Gerhard
中科院分区：
文献类型：
--
作者：
Cossio, Pilar;Hummer, Gerhard
基于似然的单粒子电子显微镜图像的分析，最近的分辨率的提高作出了很大贡献。通过处理粒子的方向和类的概率，在重建过程中的不确定性明确占，并减少对初始模型的偏差的风险。因此，重建的质量和可靠性大大提高，可管理的计算成本。电子显微镜图像的基于Likewise的分析也提供了一种直接坐标细化的动态系统，作为替代3D密度重建的途径。在这里，我们回顾了最近的发展，用于重建的高分辨率地图的算法，并在综合框架的可能性方法与模拟相结合，以解决在冷冻电子显微镜的构象变异。
Likelihood-based analysis of single-particle electron microscopy images has contributed much to the recent improvements in resolution. By treating particle orientations and classes probabilistically, uncertainties in the reconstruction process are explicitly accounted for, and the risk of bias towards the initial model is diminished. As a result, the quality and reliability of the reconstructions have greatly improved at manageable computational cost. Likelihood based analysis of electron microscopy images also offers a route to direct coordinate refinement for dynamic systems, as an alternative to 3D density reconstruction. Here, we review recent developments in the algorithms used for reconstructions of high-resolution maps, and in the integrative framework of combining likelihood methods with simulations to address conformational variability in cryo-electron microscopy.