Ferroelectricity in ultrathin perovskite films
Ferroelectricity in ultrathin perovskite films
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DOI：
10.1126/science.1098252
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发表时间：
2004-06-11
期刊：
影响因子：
56.9
通讯作者：
Thompson, C
中科院分区：
文献类型：
--
作者：
Fong, DD;Stephenson, GB;Thompson, C
理解钙钛矿薄膜中铁电性的抑制是几十年来一直没有解决的一个基本问题。我们报告了一个同步辐射X射线研究钛酸铅作为一个功能的温度和薄膜厚度的薄膜薄如一个单一的单元电池。在室温下，铁电相是稳定的厚度下降到3个单元电池（1.2纳米）。我们的结果意味着没有厚度限制施加在实际设备上的本征铁电尺寸效应。
Understanding the suppression of ferroelectricity in perovskite thin films is a fundamental issue that has remained unresolved for decades. We report a synchrotron x-ray study of lead titanate as a function of temperature and film thickness for films as thin as a single unit cell. At room temperature, the ferroelectric phase is stable for thicknesses down to 3 unit cells (1.2 nanometers). Our results imply that no thickness limit is imposed on practical devices by an intrinsic ferroelectric size effect.