High-speed electrooptic modulator characterization using optical spectrum analysis
High-speed electrooptic modulator characterization using optical spectrum analysis
复制标题
DOI：
10.1109/jlt.2003.818162
复制
发表时间：
2003-10
影响因子：
4.7
通讯作者：
Yongqian Shi;Lian-shan Yan;A. Willner
中科院分区：
文献类型：
--
作者：
Yongqian Shi;Lian-shan Yan;A. Willner
本文介绍了利用光谱分析方法表征高速电光调制器的最新研究成果。几种新的表征技术进行了理论分析和实验证明，在非常高的调制频率的关键器件参数的测量。在宽带电光调制器特性实验中，我们成功地测量了几种典型的高速LiNbO/sub 3/调制器的半波电压、频率响应和啁啾参数。实验结果表明，光谱分析为超高速电光调制器的表征提供了一个准确、方便的平台。
This paper presents our latest studies on high-speed electrooptic modulator characterization using the optical spectrum analysis method. Several new characterization techniques are theoretically analyzed and experimentally demonstrated for the measurement of critical device parameters at very high modulation frequencies. Applying this method in our wide-band electrooptic (EO) modulator characterization experiment, we have successfully measured halfwave voltages, frequency responses, and the chirp parameter at frequencies over 10 GHz for several typical high-speed LiNbO/sub 3/ modulators. Our experiment showed that the optical spectrum analysis provides an accurate and convenient platform for ultra-high-speed EO modulator characterization.