Cellular metabolic profiling using ToF-SIMS
Cellular metabolic profiling using ToF-SIMS
复制标题
使用 ToF-SIMS 进行细胞代谢分析
DOI：
10.1002/sia.5069
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发表时间：
2012
影响因子：
1.7
通讯作者：
Vaidyanathan S
中科院分区：
文献类型：
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作者：
Vaidyanathan S
与细胞代谢相关的蛋白质组和代谢组变化是重要的代谢指标，可以深入了解细胞功能。代谢物是质量通常小于 1500 Da 的小分子量细胞成分，非常适合使用 ToF-SIMS 进行检测。铋 (Bin) 和 C60 等簇离子束作为一次离子源的出现提高了溅射效率，具有更高的二次离子产率和更低的损伤截面，从而能够更好地检测这些成分。然而，光谱信息以碎片峰、基质干扰和优先电离为主，这使得应用飞行时间二次离子质谱进行非靶向分析具有挑战性。在这项研究中，讨论了检测细胞和组织代谢变化的挑战，并强调了需要进一步发展的领域。版权所有 © 2012 约翰·威利父子有限公司
Proteomic and metabolomic changes associated with cellular metabolism are important metabolic indicators that can give insight into cellular function. Metabolites are small molecular weight cellular components of mass typically <1500 Da and well suited for detection using ToF‐SIMS. The advent of cluster ion beams, such as bismuth (Bin) and C60, as primary ion sources, has improved the sputtering efficiencies, with higher secondary ion yields and lower damage cross sections, enabling better detection of these components. However, the spectral information is dominated by fragment peaks, matrix interference and preferential ionizations making it challenging to apply time‐of‐flight secondary ion mass spectrometry for non‐targeted analyses. In this investigation, the challenges in detecting metabolic changes in cells and tissues are discussed, and areas that need further development are highlighted. Copyright © 2012 John Wiley & Sons, Ltd.