Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study
Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study
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汽车微控制器内核的符号 QED 硅前验证:工业案例研究
DOI:
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发表时间:
2019
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通讯作者:
S. Mitra
中科院分区:
文献类型:
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作者:
Eshan Singh;Keerthikumara Devarajegowda;Sebastian Simon;Ralf Schnieder;K. Ganesan;M. R. Fadiheh;D. Stoffel;W. Kunz;Clark W. Barrett;W. Ecker;S. Mitra
We present an industrial case study that demonstrates the practicality and effectiveness of Symbolic Quick Error Detection (Symbolic QED) in detecting logic design flaws (logic bugs) during pre-silicon verification. Our study focuses on several microcontroller core designs (~1,800 flip-flops, ~70,000 logic gates) that have been extensively verified using an industrial verification flow and used for various commercial automotive products. The results of our study are as follows:1.Symbolic QED detected all logic bugs in the designs that were detected by the industrial verification flow (which includes various flavors of simulation-based verification and formal verification).2.Symbolic QED detected additional logic bugs that were not recorded as detected by the industrial verification flow. (These additional bugs were also perhaps detected by the industrial verification flow.)3.Symbolic QED enables significant design productivity improvements:(a)8X improved (i.e., reduced) verification effort for a new design (8 person-weeks for Symbolic QED vs. 17 person-months using the industrial verification flow).(b)60X improved verification effort for subsequent designs (2 person-days for Symbolic QED vs. 4-7 person-months using the industrial verification flow).(c)Quick bug detection (runtime of 20 seconds or less), together with short counterexamples (10 or fewer instructions) for quick debug, using Symbolic QED.