Using Negative Correlation to Evolve Fault-Tolerant Circuits
Using Negative Correlation to Evolve Fault-Tolerant Circuits
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DOI：
10.1007/3-540-36553-2_4
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发表时间：
2003-03
期刊：
影响因子：
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通讯作者：
T. Schnier;X. Yao
中科院分区：
文献类型：
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作者：
T. Schnier;X. Yao
在本文中，我们展示了如何人工进化可以用来提高电子电路的容错性。我们表明，进化是能够提高数字电路的容错性，给定一个已知的故障模型。进化还能够创造出不同的电路集合，当这些电路组合成一个整体时，它们的故障模式的相关性降低，从而提高了容错能力。用于创建电路的算法的一个重要部分是测量不同电路的故障模式之间的相关性。在适应度中使用该度量，电路向不同的、高度容错的电路进化。该措施也被证明是非常有用的健身共享的目的。我们已经发展了一个简单的2x3乘法器问题的电路数量，并使用这些来演示不同的模拟故障模型下的性能。
In this paper, we show how artificial evolution can be used to improve the fault-tolerance of electronic circuits. We show that evolution is able to improve the fault tolerance of a digital circuit, given a known fault model. Evolution is also able to create sets of different circuits that, when combined into an ensemble of circuits, have reduced correlation in their fault pattern, and therefore improved fault tolerance. An important part of the algorithm used to create the circuits is a measure of the correlation between the fault patterns of different circuits. Using this measure in the fitness, the circuits evolve towards different, highly fault-tolerant circuits. The measure also proves very useful for fitness sharing purposes. We have evolved a number of circuits for a simple 2x3 multiplier problem, and use these to demonstrate the performance under different simulated fault models.