Terahertz oscillations in an In0.53Ga0.47As submicron planar Gunn diode
Terahertz oscillations in an In0.53Ga0.47As submicron planar Gunn diode
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DOI:
10.1063/1.4868705
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发表时间:
2014-03
影响因子:
3.2
通讯作者:
A. Khalid;G. Dunn;R. F. Macpherson;S. Thoms;D. Macintyre;Chong Li;M. Steer;V. Papageorgiou;I. Thayne;Martin Kuball;C. Oxley;M. M. Bajo-M.;A. Stephen;J. Glover;D. Cumming
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文献类型:
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作者:
A. Khalid;G. Dunn;R. F. Macpherson;S. Thoms;D. Macintyre;Chong Li;M. Steer;V. Papageorgiou;I. Thayne;Martin Kuball;C. Oxley;M. M. Bajo-M.;A. Stephen;J. Glover;D. Cumming
The length of the transit region of a Gunn diode determines the natural frequency at which it operates in fundamental mode—the shorter the device, the higher the frequency of operation. The long-held view on Gunn diode design is that for a functioning device the minimum length of the transit region is about 1.5 μm, limiting the devices to fundamental mode operation at frequencies of roughly 60 GHz. Study of these devices by more advanced Monte Carlo techniques that simulate the ballistic transport and electron-phonon interactions that govern device behaviour, offers a new lower bound of 0.5 μm, which is already being approached by the experimental evidence that has shown planar and vertical devices exhibiting Gunn operation at 600 nm and 700 nm, respectively. The paper presents results of the first ever THz submicron planar Gunn diode fabricated in In0.53Ga0.47As on an InP substrate, operating at a fundamental frequency above 300 GHz. Experimentally measured rf power of 28 μW was obtained from a 600 nm lo...