Efficient Test Generation for Trojan Detection using Side Channel Analysis
Efficient Test Generation for Trojan Detection using Side Channel Analysis
复制标题
使用侧通道分析高效生成木马检测测试
DOI：
10.23919/date.2019.8715179
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发表时间：
2019
期刊：
影响因子：
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通讯作者：
P. Mishra
中科院分区：
文献类型：
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作者：
Yangdi Lyu;P. Mishra
硬件木马检测对于确保片上系统 (SoC) 设计的安全性和可信性至关重要。侧信道分析通过分析各种侧信道特征（例如功率、电流和延迟）来有效检测木马。在本文中，我们提出了一种有效的测试生成技术，以促进利用动态电流的旁道分析。虽然电流感知测试生成的早期工作提出了几个有前途的想法，但将其应用于大型设计存在两个主要挑战：（i）测试生成时间随着设计复杂性呈指数增长，以及（ii）检测特洛伊木马是不可行的，因为与噪声和过程变化相比，侧信道灵敏度是微乎其微的。我们提出的工作通过有效利用输入和稀有（可疑）节点之间的亲和力来解决这两个挑战。我们将测试生成问题形式化为搜索问题，并使用遗传算法解决优化问题。基本思想是快速找到有利可图的测试模式，可以最大化可疑区域的切换，同时最小化电路其余部分的切换。我们的实验结果表明，与最先进的测试生成技术相比，我们可以大幅提高旁路灵敏度（平均 30 倍）和时间复杂度（平均 4.6 倍）。
Detection of hardware Trojans is vital to ensure the security and trustworthiness of System-on-Chip (SoC) designs. Side-channel analysis is effective for Trojan detection by analyzing various side-channel signatures such as power, current and delay. In this paper, we propose an efficient test generation technique to facilitate side-channel analysis utilizing dynamic current. While early work on current-aware test generation has proposed several promising ideas, there are two major challenges in applying it on large designs: (i) the test generation time grows exponentially with the design complexity, and (ii) it is infeasible to detect Trojans since the side-channel sensitivity is marginal compared to the noise and process variations. Our proposed work addresses both challenges by effectively exploiting the affinity between the inputs and rare (suspicious) nodes. We formalize the test generation problem as a searching problem and solve the optimization using genetic algorithm. The basic idea is to quickly find the profitable test patterns that can maximize switching in the suspicious regions while minimize switching in the rest of the circuit. Our experimental results demonstrate that we can drastically improve both the side-channel sensitivity (30x on average) and time complexity (4.6x on average) compared to the state-of-the-art test generation techniques.