Néel temperature of Cr2O3 in Cr2O3/Co exchange-coupled system: Effect of buffer layer
Néel temperature of Cr2O3 in Cr2O3/Co exchange-coupled system: Effect of buffer layer
复制标题
Cr2O3/Co 交换耦合体系中 Cr2O3 的尼尔温度：缓冲层的影响
DOI：
10.1063/1.4917263
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发表时间：
2015
期刊：
影响因子：
--
通讯作者：
and M. Sahashi
中科院分区：
文献类型：
--
作者：
S. Pati;N. Shimomura; T. Nozaki;T. Shibata;and M. Sahashi
研究了Cr{sub2}O{sub3}/Co交换耦合体系中薄Crsub2}O{sub3}的Néel温度T{subN}与晶格参数的关系。通过使用不同的缓冲层，在Cr{sub2}O{sub3}中产生晶格失配诱导应变。晶格参数由面外和面内X射线衍射测量确定。通过直接测量随温度变化的磁化强度和随温度变化的界面交换耦合能来检测Néel温度。观察到面内晶格收缩可以提高Cr{sub2}O{sub3}中的T{subN}，这与理论计算一致。
The lattice parameter dependence of the Néel temperature T{sub N} of thin Cr{sub 2}O{sub 3} in a Cr{sub 2}O{sub 3}/Co exchange-coupled system is investigated. Lattice-mismatch-induced strain is generated in Cr{sub 2}O{sub 3} by using different buffer layers. The lattice parameters are determined from out-of-plane and in-plane X-ray diffraction measurements. The Néel temperature is detected by direct temperature-dependent magnetization measurement as well as the temperature-dependent interface exchange coupling energy. It is observed that in-plane lattice contraction can enhance T{sub N} in Cr{sub 2}O{sub 3}, which is consistent with theoretical calculations.