MINIATURE ELECTRICAL FILTERS FOR SINGLE ELECTRON DEVICES
MINIATURE ELECTRICAL FILTERS FOR SINGLE ELECTRON DEVICES
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用于单电子器件的微型滤波器
DOI：
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发表时间：
1995
期刊：
影响因子：
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通讯作者：
M. Devoret
中科院分区：
文献类型：
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作者：
D. Vion;P. F. Orfila;P. Joyez;D. Estève;M. Devoret
在单电子器件的实验中，在高于器件温度的温度下，来自设备部件的电磁噪声可以显著增加库仑阻塞状态的隧道速率，从而增加器件的错误率。因此，电线必须充分过滤。我们推导出计算所需衰减系数的简单表达式。我们描述了一种在低温下工作的宽带微型耗散滤波器。在30 mK的实验的有效热化可以通过将这些过滤器中的四个串联在4 K至30 mK的温度范围内来获得。
In experiments on single electron devices, the electromagnetic noise from parts of the apparatus at temperatures higher than that of the device can dramatically increase the tunnel rates out of the Coulomb‐blocked state and therefore increase the device error rate. The electrical lines must therefore be filtered adequately. We derive simple expressions for calculating the required attenuation coefficient. We describe a wide‐band miniature dissipative filter functioning at cryogenic temperatures. The effective thermalization of an experiment at 30 mK can be obtained by placing four of these filters in series at temperatures ranging from 4 K to 30 mK.