Electron Microscopy and Microanalysis Study of La1.89Ce0.11CuO4/Ba0.5Sr0.5TiO3/La0.67Sr0.33MnO3 Heterostructure
Electron Microscopy and Microanalysis Study of La1.89Ce0.11CuO4/Ba0.5Sr0.5TiO3/La0.67Sr0.33MnO3 Heterostructure
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DOI：
10.1017/s1431927619012698
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发表时间：
2019-08
影响因子：
2.8
通讯作者：
Fengjin Xia;Jie Wang;Shuai Ma;Jianguang Feng;Lifeng Dong
中科院分区：
文献类型：
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作者：
Fengjin Xia;Jie Wang;Shuai Ma;Jianguang Feng;Lifeng Dong
目前，全钙钛矿氧化物薄膜异质结构由于其在新型器件中的潜在应用而受到越来越多的关注。它们的性能取决于异质结构的界面结构，而界面结构与薄膜生长过程有很强的相关性，特别是对于多层结构。在这项研究中，我们研究了全钙钛矿氧化物异质结构的界面，以揭示界面结构和生长过程之间的相关性。p-i-n异质结构由锰氧化物La_（0.67）Sr_（0.33）MnO_3（LSMO）、铁电体Ba_（0.5）Sr_（0.5）TiO_3（BST）和电子掺杂高Tc超导体La_（1.89）Ce_（0.11）CuO_4（LCCO）组成，它们分别起p型层、阻挡层（i）和n型层的作用。
Currently, all-perovskite oxide thin film heterostructures have attracted more and more attentions due to their potential applications in new kinds of devices. Their performances depend on interfacial structures of the heterostructures, and the interfacial structures have a strong correlation with thin film growth processes, especially for multilayer structures. In this study, we investigate the interfaces of an allperovskite oxide heterostructure to reveal the correlation between interfacial structures and the growth processes. The p-i-n heterostructure is composed of manganite La0.67Sr0.33MnO3 (LSMO), ferroelectric Ba0.5Sr0.5TiO3 (BST) and electron-doped high-Tc superconductor La1.89Ce0.11CuO4 (LCCO), which function as p-type layer, barrier layer (i), and n-type layer, respectively.