Investigation of oxygen diffusion behavior in terbium using O-18(2) isotopic tracking by high resolution SIMS

Investigation of oxygen diffusion behavior in terbium using O-18(2) isotopic tracking by high resolution SIMS
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使用高分辨率 SIMS 进行 O-18(2) 同位素追踪研究铽中的氧扩散行为

DOI:
10.1016/j.matlet.2016.04.128
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发表时间:
2016
期刊:
影响因子:
3
通讯作者:
Li Xingguo
Li Xingguo
中科院分区:
材料科学3区
文献类型:
--
作者:
Li Guoling;Li Li;Hao Jialong;Zheng Jie;Tian Wenhuai;Li Xingguo

文献摘要

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采用高分辨二次离子质谱(西姆斯)技术研究了高纯金属铽(Tb)在含18 O2同位素的腐蚀环境中的氧化机理。计算了天然气氛下~(18)O在Tb中的扩散系数,为后续的提纯和工业应用提供了依据。动力学转变后18 O的特征分布有明显的证据。迁移行为与金属中缺陷的存在相关,这些缺陷允许腐蚀以局部成核的形式发生。建立了一套描述氧化过程的电离模型。
High resolution secondary ion mass spectrometry (SIMS) analysis has been used to study the oxidation mechanisms when high purity terbium (Tb) metal is exposed to corroding environments containing18O2isotope. The diffusion coefficients for18O in Tb at a natural atmosphere can be calculated, which plays an important role in subsequent purification and application in industry. Clear evidence has been shown for the characteristic distributions of18O after the kinetic transitions. The migration behavior is correlated with the existence of defects in the metal which allow the corrosions occur as localized nucleation. A set of ionization model has been developed to describe the oxidation process.