Transmission electron microscopy observation of high-temperature γ-FeSi2 precipitates formed in Si by iron implantation using a metal vapor vacuum arc ion source
Transmission electron microscopy observation of high-temperature γ-FeSi2 precipitates formed in Si by iron implantation using a metal vapor vacuum arc ion source
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DOI:
10.1063/1.1594832
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发表时间:
2003-07
影响因子:
4
通讯作者:
Yang Gao;S. Wong;W. Cheung;G. Shao;K. Homewood
中科院分区:
文献类型:
--
作者:
Yang Gao;S. Wong;W. Cheung;G. Shao;K. Homewood
This work reports the observation of high-temperature γ-FeSi2 precipitates of tens of nanometers in diameter embedded in silicon formed by iron implantation using a metal vapor vacuum arc ion source followed by a dual step annealing process. It was found that the implantation temperature and annealing conditions played important roles on the shape and phase formation of the FeSi2 precipitates. When the implantation temperature was high (about 380 °C), only β-FeSi2 precipitates were formed. When the implantation temperature was low (about −100 °C), after the dual step annealing, in addition to β-FeSi2, γ-FeSi2 precipitates coherent with the silicon substrate were formed.