Electron diffraction of thin-film pentacene

Electron diffraction of thin-film pentacene
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薄膜并五苯的电子衍射

DOI:
10.1107/s0021889803025093
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发表时间:
2004
影响因子:
6.1
通讯作者:
J. Spence
J. Spence
中科院分区:
材料科学3区
文献类型:
--
作者:
J. Wu;J. Spence

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用电子衍射法研究了在氯化钠衬底上沉积的并五苯薄膜的结构。用电子显微镜倾斜晶体的一系列衍射图测定了薄膜相[a=6.1 (1),b=7.6 (1),c=15.3 (3) A,α=81.0 (16),β=85.0 (17),γ=89.5 (9)°]的晶格参数。该相的(001)d间距为15.1 (3) A,讨论了分子在结构中的堆积。
The structure of pentacene thin films deposited on NaCl substrates have been studied by electron diffraction. The lattice parameters of a `thin film' phase [a = 6.1 (1), b = 7.6 (1), c = 15.3 (3) A, α = 81.0 (16), β = 85.0 (17), γ = 89.5 (9)°] were determined using a series of diffraction patterns obtained by tilting the crystal in the electron microscope. This phase has a (001) d spacing of 15.1 (3) A. The packing of molecules in the structure is discussed.
J.不太常见的 Met.115。
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