M.Sugahara: "Film Thickness Dependence of Anomalous Dielectric Property Found in C-Axis Oriented La2-xSrxCuO4 Film with Localization" to be published in Proceedings of 11th Internationl Symposium on Superconductivity (ISS'98) , Fukuoka, 1998.
M.Sugahara: "Film Thickness Dependence of Anomalous Dielectric Property Found in C-Axis Oriented La2-xSrxCuO4 Film with Localization" to be published in Proceedings of 11th Internationl Symposium on Superconductivity (ISS'98) , Fukuoka, 1998.
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M.Sugahara：“Film Thickness Dependence of Anomalyous Dielectric Property Found in C-Axis Oriented La2-xSrxCuO4 Film with Localization”将发表于第 11 届国际超导研讨会论文集 (ISS98)，福冈，1998 年。
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