Trace element determination using static high-sensitivity inductively coupled plasma optical emission spectrometry (SHIP-OES).
Trace element determination using static high-sensitivity inductively coupled plasma optical emission spectrometry (SHIP-OES).
复制标题
使用静态高灵敏度电感耦合等离子体发射光谱法 (SHIP-OES) 测定痕量元素。
作者：
C. Engelhard;A. Scheffer;S. Nowak;Torsten Vielhaber;W. Buscher
