Substrate dependence of adlayer optical response in reflectance anisotropy spectroscopy
Substrate dependence of adlayer optical response in reflectance anisotropy spectroscopy
复制标题
反射各向异性光谱中吸附层光学响应的基底依赖性
DOI:
10.1116/1.581464
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发表时间:
1998
期刊:
影响因子:
--
通讯作者:
P. Weightman
中科院分区:
文献类型:
--
作者:
R. Cole;B. Frederick;P. Weightman
Reflectance anisotropy spectroscopy (RAS) offers extreme surface sensitivity and can be used to study gas-solid and solid-liquid interfaces. Although the technique has already made a considerable contribution to in situ monitoring of the epitaxial growth of semiconductors, its impact has thus far been limited by difficulties in interpreting experimental results. In particular, RAS spectra are related to both Δe2′ and Δe2″, the real and imaginary parts of the surface dielectric anisotropy, with weighting factors determined by the complex dielectric function of the substrate. Here RAS calculations are performed for a variety of substrates assuming a model overlayer dielectric anisotropy. Three distinct regimes of behavior are observed: RAS spectra can resemble either Δe2′, Δe2″ or −Δe2″ (or some combination of the three) depending on the substrate and the photon energy. It is therefore crucial to properly account for these substrate effects if RAS is to be used to determine the azimuthal orientation of adso...