Charge Carrier Lifetime Determination in Graded Absorber Solar Cells Using Time‐Resolved Photoluminescence Simulations and Measurements
Charge Carrier Lifetime Determination in Graded Absorber Solar Cells Using Time‐Resolved Photoluminescence Simulations and Measurements
复制标题
使用时间分辨光致发光模拟和测量确定分级吸收器太阳能电池中的电荷载流子寿命
DOI:
10.1002/solr.202201029
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发表时间:
2023
期刊:
影响因子:
7.9
通讯作者:
Kuciauskas, Darius
中科院分区:
文献类型:
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作者:
Bothwell, Alexandra M.;Reich, Carey L.;Danielson, Adam H.;Onno, Arthur;Holman, Zachary C.;Sampath, Walajabad S.;Kuciauskas, Darius
Thin‐film photovoltaic device efficiencies are limited by carrier recombination, thus understanding recombination mechanisms is critical for performance improvements. Bulk minority carrier lifetime (τbulk) is a critical parameter for solar cells but is difficult to determine in P–N junction devices, especially for high doping. As doping ≥1016cm−3is required for efficient drift‐charge‐carrier‐collection devices, a method forτbulkdetermination in doped P–N junction devices is necessary. This work utilizes time‐resolved photoluminescence (TRPL) simulations to quantify bulk and interface recombination properties in highly doped, graded absorber CdSeTe structures. The two methods developed here forτbulkdetermination include utilization of an instantaneous lifetime representation to guide TRPL fitting and direct comparison between measured and simulated decays. Simulations verified that both methods are valid for state‐of‐the‐art device architectures which include graded bandgap absorbers, graded doping, and graded lifetimes. Shifts in the dominant recombination mechanism are identified for sufficiently longτbulk, where front and back interface quality plays a more prominent role. Evaluation of surface recombination velocities and conduction band offset illustrate electro‐optical advantages of a positive conduction band offset and highlight the necessity of improved interfaces as bulk quality in photovoltaic devices improves.
DOI:
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发表时间:
2020
期刊:
影响因子:
--
作者:
Mathias C Brandt;Hannes Alber;Rudolf Berger;Ronald K Binder;J. Mascherbauer;Alexander Niessner;Martin Schmid;B. Wernly;Matthias Frick
通讯作者:
Matthias Frick