Image force microscopy of molecular resonance: A microscope principle
Image force microscopy of molecular resonance: A microscope principle
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DOI：
10.1063/1.3480608
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发表时间：
2010-08-16
影响因子：
4
通讯作者：
Wickramasinghe, H. Kumar
中科院分区：
文献类型：
--
作者：
Rajapaksa, I.;Uenal, K.;Wickramasinghe, H. Kumar
我们展示了一种显微镜技术，它将原子力显微镜的领域扩展到纳米级的光学光谱。我们表明，通过机械检测光学驱动的分子偶极子与其镜像之间的相互作用之间的力梯度，可以检测和成像特征尺寸小到单分子水平的分子共振。这种显微镜和光谱学技术可以扩展到从无线电到红外和紫外线的频率。(C)2010年美国物理研究所。[DOI：10.1063/1.3480608]
We demonstrate a technique in microscopy which extends the domain of atomic force microscopy to optical spectroscopy at the nanometer scale. We show that molecular resonance of feature sizes down to the single molecular level can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole and its mirror image in a platinum coated scanning probe tip. This microscopy and spectroscopy technique is extendable to frequencies ranging from radio to infrared and the ultraviolet. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3480608]