Near-edge X-ray absorption fine structure study of vertically aligned carbon nanotubes grown by the surface decomposition of SiC
Near-edge X-ray absorption fine structure study of vertically aligned carbon nanotubes grown by the surface decomposition of SiC
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SiC表面分解生长垂直排列碳纳米管的近边X射线吸收精细结构研究
DOI：
10.1143/jjap.51.055102
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
Toshiaki Ohta (T. Maruyama)
中科院分区：
文献类型：
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作者：
Takahiro Maruyama;Yuki Ishiguro;Shigeya Naritsuka;Wataru Norimatsu;Michiko Kusunoki;Kenta Amemiya;Hideshi Ishii;Toshiaki Ohta (T. Maruyama)
用线偏振X射线束变角C-K边近边X射线吸收精细结构谱(NEXAFS)研究了碳化硅表面分解生长的垂直定向碳纳米管(CNTs)。在总电子产额模式下测得的NEXAFS谱与π*和σ*的共振角关系明显，取向参数初步估计为0.38，这比用化学气相沉积生长的其他垂直排列的碳纳米管的取向参数要大得多。NEXAFS测量首次证明了碳化硅表面分解法制备的碳纳米管具有高度的垂直排列。
Vertically aligned carbon nanotubes (CNTs) grown by the surface decomposition of SiC were studied by angular-dependent C K-edge near-edge X-ray absorption fine structure spectroscopy (NEXAFS) with a linearly polarized X-ray beam. The NEXAFS spectra measured in total electron yield mode showed a distinct angular dependence on π* and σ* resonances and the orientation parameter was tentatively estimated to be 0.38, which is fairly larger than those reported for other vertically aligned CNTs grown by chemical vapor deposition. The high order of the vertical alignment of CNTs grown by the surface decomposition of SiC was demonstrated by NEXAFS measurements for the first time.