Out-of-plane and in-plane ferroelectricity of atom-thick two-dimensional InSe
Out-of-plane and in-plane ferroelectricity of atom-thick two-dimensional InSe
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DOI:
10.1088/1361-6528/ac0ac5
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发表时间:
2021-06
期刊:
影响因子:
3.5
通讯作者:
Haowen Hu;Huaipeng Wang;Yilin Sun;Jiawei Li;J. Wei;D. Xie;Hongwei Zhu
中科院分区:
文献类型:
--
作者:
Haowen Hu;Huaipeng Wang;Yilin Sun;Jiawei Li;J. Wei;D. Xie;Hongwei Zhu
Two-dimensional (2D) ferroelectric materials are promising substitutes of three-dimensional perovskite based ferroelectric ceramic materials. Yet most studies have been focused on the construction of non-centrosymmetric 2D van der Waals materials and only a few are constructed experimentally. Herein, we experimentally demonstrate the co-existence of voltage-tunable out-of-plane (OOP) and in-plane (IP) ferroelectricity in few-layer InSe prepared by a solution-processable method and fabricate ferroelectric semiconductor channel transistors. The reversible polarization can initiate instant switch of resistance with high ON/OFF ratios and a comparable subthreshold swing of 160 mV/dec under gate modulation. The origins of such unique OOP and IP ferroelectricity of the centrosymmetric structure are theoretically analyzed.