A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA
A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA
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使用 FPGA 实现超快反馈控制电迁移的完全定制硬件系统
DOI：
10.1109/nano.2014.6968058
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
R. Suda and J. Shirakashi
中科院分区：
文献类型：
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作者：
Y. Kanamaru;M. Ando;R. Suda and J. Shirakashi
与其他方法相比，用于制造纳米间隙的电迁移（EM）方法特别简单，因为它仅通过使电流通过金属纳米线来实现。然而，典型的EM过程引起产生具有高隧道电阻的纳米间隙的突然断裂。因此，已经报道了各种方法来解决这个问题，并且反馈控制电迁移（FCE）方案已经成功地用于安全可靠地制造纳米间隙。另一方面，使用具有通用操作系统的基于微处理器的控制器通过FCE方法形成纳米间隙是相当慢的过程。在这项研究中，我们使用现场可编程门阵列（FPGA）设计了一个新的系统。此外，我们将该系统应用到Au μ m线。因此，使用基于FPGA的控制系统的FCE实验在20 μsec的确定性循环时间下进行。此外，电导率可在1 s内从10 mS精确调节到77.5 μS以下，比采用微处理器控制的常规FCE缩短了102- 3倍。
Electromigration (EM) method for the fabrication of nanogaps is specifically simple as compared with other methods because it is achieved by only passing a current through a metal nanowire. However, typical EM procedure induces an abrupt break that yields a nanogap with high tunnel resistance. Hence, various approaches have been reported to address this problem, and feedback-controlled electromigration (FCE) scheme has been successfully employed to make nanogaps safely and reliably. On the other hand, the formation of nanogaps by FCE method using a microprocessor-based controller with a general purpose operating system is considerably slow process. In this study, we designed a new system using field programmable gate array (FPGA). Furthermore, we applied this system to Au μm-wires. Consequently, the FCE experiments using FPGA-based control system were performed at 20 μsec of deterministic loop time. In addition, conductance was precisely controlled and adjusted from 10 mS to less than 77.5 μS for within 1 sec, which is 102-3times shorter than that of conventional FCE procedure using microprocessor-based control system.