Correlation between Chemical and Physical Pressures on Charge Bistability in [Pd(en)2Br](Suc-Cn)2・H2O
Correlation between Chemical and Physical Pressures on Charge Bistability in [Pd(en)2Br](Suc-Cn)2・H2O
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[Pd(en)2Br](Suc-Cn)2·H2O 中化学和物理压力与电荷双稳定性的相关性
DOI：
10.1021/acs.inorgchem.7b02566
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发表时间：
2018
期刊：
影响因子：
4.6
通讯作者：
Masahiro Yamashita
中科院分区：
文献类型：
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作者：
Shohei Kumagai;Shinya Takaishi;Hiroaki Iguchi;Brian K. Breedlove;Takuya Kaneko;Hiroshi Ito;Shin-ichi Kuroda;Masahiro Yamashita
研究了静水压（物理压力）对溴桥钯化合物[Pd（en）2Br]（Suc-C5）2·H2O电阻率的影响。Mott-Hubbard相变温度（TPT）的电荷密度波随压力的增加而稳定增加。通过比较化学压力和物理压力对TPT的影响，估计了单位烷基链长的化学压力，在该配体中烷基链中的碳原子数对应于Ca。1.3 Kbar的物理压力。
Hydrostatic (physical) pressure effects on the electrical resistivity of a bromido-bridged palladium compound, [Pd(en)2Br](Suc-C5)2·H2O, were studied. The charge-density-wave to Mott–Hubbard phase transition temperature (TPT) steadily increased with pressure. By a comparison of the effects of the chemical and physical pressures onTPT, it was estimated that the chemical pressure by unit alkyl chain length, i.e., the number of carbon atoms in the alkyl chains within the counterion, corresponded to ca. 1.3 kbar of the physical pressure.