Hard x‐ray detector based on microchannel plates
Hard x‐ray detector based on microchannel plates
复制标题
基于微通道板的硬X射线探测器
DOI：
10.1063/1.1146844
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发表时间：
1996
影响因子：
1.6
通讯作者：
P. Shikhaliev
中科院分区：
文献类型：
--
作者：
P. Shikhaliev
介绍了一种基于微通道板的高效硬X射线探测器。检测到的 X 射线束垂直指向微通道板转换器的侧面。对于截面为 2×2 mm、能量为 662 keV 和 122 keV 的光束，检测效率分别为 24% 和 35%。测量了 X 射线与微通道板材料相互作用的概率。对于 122 和 662 keV 辐射，探测器位置分辨率为 0.5 和 1.5 mm。
A high efficiency detector of hard x ray based on microchannel plates is described. The detected x‐ray beam was directed perpendicularly to the lateral surface of microchannel plate convertors. The detection efficiency for beams with 2×2 mm cross section and energies of 662 and 122 keV was 24% and 35%, respectively. The probability of x‐ray interaction with microchannel plate material was measured. The detector position resolution is 0.5 and 1.5 mm for 122 and 662 keV radiation.