Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography
Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography
复制标题
硬X射线纳米干涉仪及其在高分辨率相位层析成像中的应用
DOI：
10.1143/jjap.45.l1159
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发表时间：
2006
影响因子：
1.5
通讯作者：
Y. Kagoshima
中科院分区：
文献类型：
--
作者：
T. Koyama;T. Tsuji;Keisuke Yoshida;H. Takano;Y. Tsusaka;Y. Kagoshima
研制了一种采用两种波带片的硬X射线纳米干涉仪。一种是用于显微镜物镜的普通波带板，另一种是用于配置参考波的新设计的波带板，称为环形波带板。我们已经成功地产生了周期可变的干涉条纹，直至无条纹的图案。在8keV的光子能量下，聚苯乙烯微粒的空间分辨率为60 nm，位相灵敏度为λ/40，可以清晰地显示出聚苯乙烯微粒的相移分布。并将该干涉仪应用于相位层析成像，实现了高空间分辨率的三维观测。
A hard X-ray nano-interferometer using two types of zone plate has been developed. One is an ordinary zone plate for a microscope objective, and the other is a newly designed zone plate called an “annular zone plate” for configuring reference waves. We have succeeded in producing interference fringes with variable periods up to a fringeless pattern. The phase-shift distribution of polystyrene microparticles could be imaged clearly with a spatial resolution of 60 nm and a phase sensitivity of λ/40 at a photon energy of 8 keV. Furthermore, this interferometer was applied to phase tomography for high-spatial-resolution three-dimensional observation.