Acoustic resonant spectroscopy for characterization of thin polymer films
Acoustic resonant spectroscopy for characterization of thin polymer films
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DOI：
10.1063/1.2356859
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发表时间：
2006-10-01
影响因子：
1.6
通讯作者：
Saka, Masumi
中科院分区：
文献类型：
--
作者：
Tohmyoh, Hironori;Imaizumi, Takuya;Saka, Masumi
提出了一种用于测量微米级聚合物薄膜的声阻抗、超声速度和密度的声共振光谱技术。该方法基于频谱分析，观察了水、薄膜和高声阻抗钨板在20-70 MHz频率范围内的声共振。被测薄膜与平板之间的界面是真空密封的，这使我们能够表征声阻抗低至约1.9 MN m(-3) s的低密度聚乙烯薄膜和厚度约8 μ m的聚氯乙烯薄膜。薄膜密度测量的误差小于1%，验证了该技术的有效性。(c) 2006年美国物理研究所。
An acoustic resonant spectroscopy technique for measuring the acoustic impedance, ultrasonic velocity, and density of micron-scale polymer films is developed. The method, which is based on spectral analysis, observes the acoustic resonance between water, the film, and a tungsten plate with high acoustic impedance in the frequency range of 20-70 MHz. The interface between the film being examined and the plate is vacuum sealed, enabling us to characterize the low-density polyethylene film with acoustic impedances as low as about 1.9 MN m(-3) s and the poly(vinyl chloride) film as thin as about 8 mu m. The error in the film density measurements is found to be less than 1%, and the validity of the technique is verified. (c) 2006 American Institute of Physics.