Spectrometer for polarized soft X-ray Raman scattering.
Spectrometer for polarized soft X-ray Raman scattering.
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用于偏振软 X 射线拉曼散射的光谱仪。
DOI：
10.1107/s0909049597019481
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发表时间：
1998
影响因子：
2.5
通讯作者：
A. Yagishita
中科院分区：
文献类型：
--
作者：
Y. Harada;H. Ishii;M. Fujisawa;Y. Tezuka;S. Shin;M. Watanabe;Y. Kitajima;A. Yagishita
建立了一套极化软x射线拉曼散射光谱实验系统。软x射线光谱仪是基于罗兰圆几何的全息球面光栅。三种类型的光栅用于覆盖从18 eV到1200 eV的能量范围。根据射线追踪模拟，通过使用10微米狭缝宽度，在700 eV下分辨率有望达到200 meV。通过绕入射光束轴旋转软x射线光谱仪，可以测量软x射线偏振和去偏振拉曼散射光谱。在光子工厂的波束线BL-2C上完成了偏振光谱和去偏振光谱的初步测量。
An experimental system for polarized soft X-ray Raman scattering spectroscopy has been constructed. The soft X-ray spectrometer is based on the Rowland circle geometry with a holographic spherical grating. Three types of gratings are used to cover the energy range from 18 eV to 1200 eV. According to a ray-trace simulation, the resolution is expected to be 200 meV at 700 eV by using a 10 micro m slit width. The polarized and depolarized soft X-ray Raman scattering spectra can be measured by rotating the soft X-ray spectrometer around the axis of the incident beam. Preliminary measurements of polarized and depolarized spectra were accomplished at undulator beamline BL-2C of the Photon Factory.