Exchange bias and domain evolution at 10 nm scales.
Exchange bias and domain evolution at 10 nm scales.
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10 nm 尺度上的交换偏差和域演化。
DOI：
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发表时间：
2010
影响因子：
8.6
通讯作者：
E. Fullerton
中科院分区：
文献类型：
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作者：
I. Schmid;M. Marioni;P. Kappenberger;S. Romer;M. Parlińska;H. Hug;O. Hellwig;M. Carey;E. Fullerton
对固定面积为2 μm×2 μm的Co/Pt-CoO垂直交换偏置系统，用磁力显微镜（MFM）对不同外加磁场下的铁磁畴进行了10 nm分辨率的成像。使用定量MFM，我们测量的局部面密度的钉扎未补偿的自旋（pinUCS）在反铁磁（AFM）CoO层和相关的FM域结构与UCS密度。较大的施加场将后退域驱动到按比例较高的pinUCS区域，该区域与FM矩反平行对齐。数据证实，FM域的演变是由AFM层中的pinUCS决定的，并且还呈现了系统中的挫折的例子。
For a fixed 2 μm×2 μm area of a Co/Pt-CoO perpendicular exchange bias system we image the ferromagnetic (FM) domains for various applied fields with 10-nm resolution by magnetic force microscopy (MFM). Using quantitative MFM we measure the local areal density of pinned uncompensated spins (pinUCS) in the antiferromagnetic (AFM) CoO layer and correlate the FM domain structure with the UCS density. Larger applied fields drive the receding domains to areas of proportionally higher pinUCS aligned antiparallel to FM moments. The data confirm that the evolution of the FM domains is determined by the pinUCS in the AFM layer, and also present examples of frustration in the system.