Large-range high-speed dynamic-mode atomic force microscope imaging: adaptive tapping towards minimal force
Large-range high-speed dynamic-mode atomic force microscope imaging: adaptive tapping towards minimal force
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DOI：
10.1088/1361-6528/acd700
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发表时间：
2023-05
期刊：
影响因子：
3.5
通讯作者：
Jiarong Chen;Q. Zou
中科院分区：
文献类型：
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作者：
Jiarong Chen;Q. Zou
在本文中，在各种应用中，需要一种软件硬件的集成方法，用于原子力显微镜的高速攻击模式成像（AFM）。高度敏感的探针间距，因此很难通过硬件带宽的速度保持速度。速度但是，扫描尺寸的损失受到了硬件的限制，并且在线信号处理速度和计算复杂性涉及的，在本文中，AMLM技术进一步增强，以优化探针敲击调节，并与现场可编程阵列平台相成，以进一步提高质量范围的较高的成像范围。成像可以以100 Hz及更高的高速扫描速率以及超过20μm的大型成像区域实现。
In this paper, a software-hardware integrated approach is proposed for high-speed, large-range tapping mode imaging of atomic force microscope (AFM). High speed AFM imaging is needed in various applications, particularly in interrogating dynamic processes at nanoscale such as polymer crystallization process. Achieving high speed in tapping-mode AFM imaging is challenging as the probe-sample interaction during the imaging process is highly nonlinear, making the tapping motion highly sensitive to the probe sample spacing, and thereby, difficult to maintain at high speed. Increasing the speed via hardware bandwidth enlargement, however, leads to a substantially reduction of the imaging area. Contrarily, the imaging speed can be increased without loss of the scan size through control (algorithm)-based approach. For example, the recently-developed adaptive multiloop mode (AMLM) technique has demonstrated its efficacy in increasing the tapping-mode imaging speed without loss of scan size. Further improvement, however, has been limited by the hardware bandwidth and the online signal processing speed and computation complexity involved. Thus, in this paper, the AMLM technique is further enhanced to optimize the probe tapping regulation, and integrated with a field programmable gate array platform to further increase the imaging speed without loss of quality and scan range. Experimental implementation of the proposed approach demonstrates that high-quality imaging can be achieved at a high-speed scanning rate of 100 Hz and higher, and over a large imaging area of over 20 μm.