Losses of runaway electrons during ergodization
Losses of runaway electrons during ergodization
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DOI：
10.1088/0029-5515/46/4/s04
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发表时间：
2006-04
期刊：
影响因子：
3.3
通讯作者：
K. Finken;S. Abdullaev;M. Jakubowski;R. Jaspers;M. Lehnen;O. Zimmermann
中科院分区：
文献类型：
--
作者：
K. Finken;S. Abdullaev;M. Jakubowski;R. Jaspers;M. Lehnen;O. Zimmermann
TEXTOR的动态遍历分流器（DED）已应用于失控排放。利用ε < 30 MeV的失控电子作为探测等离子体内部磁力线结构的探针。补充诊断的使用，即中子测量的损失失控和同步辐射的检测等离子体内部。在DED阶段，发现了失控电子的三个特征：刚形成的遍历层的突然损失，增强的扩散输运和可能与场线重连过程有关的非常突然的损失事件。
The dynamic ergodic divertor (DED) of TEXTOR has been applied to runaway discharges. The runaway electrons (ε < 30 MeV) are developed as probes for investigating the internal magnetic field line structure in the plasma. Complementary diagnostics are used, namely neutron measurements for the loss of the runaways and synchrotron radiation for the detection inside the plasma. During the DED phase, three features of the runaway electrons are found: a sudden loss from the just formed ergodic layer, an enhanced diffusive transport and very sudden loss events which may be related to field line reconnection processes.