Size dependence of buckling strains of Cr films, Cu films and Cu/Cr multilayers on compliant substrates
Size dependence of buckling strains of Cr films, Cu films and Cu/Cr multilayers on compliant substrates
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DOI：
10.1016/j.scriptamat.2017.10.025
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发表时间：
2018-03
影响因子：
6
通讯作者：
K. Wu;H. Yuan;X. Liang;J. Y. Zhang;G. Liu;Jun Sun
中科院分区：
文献类型：
--
作者：
K. Wu;H. Yuan;X. Liang;J. Y. Zhang;G. Liu;Jun Sun
The buckling strainεBof Cr films and Cu films exhibits opposite film thicknesshdependence: theεBof Cr films decreases monotonically, while theεBof Cu films increases monotonically with the increasingh. The delamination of Cr films follows the strain energy criterion while the Cu films are buckle-limited. TheεBof Cu/Cr nanostructured metallic multilayers (NMMs), much higher than that of Cr films, increases as the modulation periodλincreases. A modified strain energy criterion involving interfacial adhesion and plastic deformation has been developed to describe the evolution ofεBof Cu/Cr NMMs withλ.
