Measurement Technique for Microwave Surface Resistance of Additive Manufactured Metals

Measurement Technique for Microwave Surface Resistance of Additive Manufactured Metals
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增材制造金属微波表面电阻测量技术

DOI:
10.1109/tmtt.2020.3035082
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发表时间:
2021
影响因子:
4.3
通讯作者:
Gumbleton R
Gumbleton R
中科院分区:
工程技术1区
文献类型:
--
作者:
Gumbleton R

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增材制造(AM)金属由于其在无源微波应用中的性能而备受关注。然而,由于制造过程产生的伪影,例如表面纹理和/或粗糙度,可能会出现限制。因此,我们采用了一种平行板微波谐振器,用于精确测量金属平板的表面电阻,通过简单地激发不同的谐振模式(在5.3和6.4 GHz),允许微波电流在两个正交方向上流动,而不需要移除和重新固定样品。与表面电阻测量相关的系统误差和随机误差非常小,分别小于1%和0.1%。该技术被证明与测量范围内的合金,AlSi 10 Mg和Ti6 Al 4V,制造激光粉末床融合,除了传统的加工样品的铝和黄铜的大块金属合金的样品。对于AM样品的AlSi 10 Mg,我们已经研究了定向粗糙度功能,产生的激光光栅路径,在横向或平行于微波电流的方向上的表面电阻的效果。重要的是,对于无源微波器件的应用,我们证明,这些样品表现出与这种表面特征相关的表面电阻没有系统的各向异性。
Additive manufactured (AM) metals are a subject of much interest for their performance in passive microwave applications. However, limitations could arise due to artifacts, such as surface texture and/or roughness resulting from the manufacturing process. We have, therefore, adopted a parallel plate microwave resonator for the accurate measurement of the surface resistance of flat metal plates, allowing for microwave current flow in two orthogonal directions by simply exciting a different resonant mode (at 5.3 and 6.4 GHz), without the need to remove and refix the sample. The systematic and random errors associated with the measurement of surface resistance are very small, less than 1% and 0.1%, respectively. The technique is demonstrated with measurements on a range of samples of the alloys, AlSi10Mg and Ti6Al4V, manufactured by laser powder bed fusion, in addition to traditionally machined samples of bulk metal alloys of aluminum and brass. For AM samples of AlSi10Mg, we have studied the effect on the surface resistance of directional roughness features, generated by the laser raster paths, in directions transverse or parallel to microwave current flow. Importantly for passive microwave device applications, we demonstrate that these samples exhibit no systematic anisotropy of surface resistance associated with such surface features.
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