小川智哉: "Characterization of interface and sumface structures by ultra-thin film interference fringes" Institute of Physics,Conference Series. 135. 267-270 (1994)
小川智哉: "Characterization of interface and sumface structures by ultra-thin film interference fringes" Institute of Physics,Conference Series. 135. 267-270 (1994)
复制标题
Tomoya Okawa:“通过超薄膜干涉条纹表征界面和表面结构”物理研究所,会议系列135. 267-270 (1994)。
DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
中科院分区:
文献类型:
--
作者: