Improving Peak-Wavelength Method to Measure Junction Temperature by Dual-Wavelength LEDs
Improving Peak-Wavelength Method to Measure Junction Temperature by Dual-Wavelength LEDs
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DOI：
10.1109/access.2017.2716781
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发表时间：
2017-06
期刊：
影响因子：
3.9
通讯作者：
Yukun Zhao;F. Yun;Lungang Feng;Shuai Wang;Yufeng Li;X. Su;Maofeng Guo;Wen Ding;Ye Zhang
中科院分区：
文献类型：
--
作者：
Yukun Zhao;F. Yun;Lungang Feng;Shuai Wang;Yufeng Li;X. Su;Maofeng Guo;Wen Ding;Ye Zhang
本文对发光二极管（LED）结温测量方法的改进进行了实验研究。提出了一种实用的方法，只有三个测量程序。该方法考虑了铟（In）组分和蓝移的影响，具有很高的适用性，适用于不同电流下的蓝光到绿色LED芯片，包括封装芯片。另一方面，根据实验和推导的结果，在蓝移和红移场中，结温差和峰值波长移动呈现类似的抛物线关系。为了简化实验过程，制造和测量双波长LED，而不是传统的单波长LED。
In this paper, the improvement of the method measuring the junction temperature of light-emitting diodes (LEDs) has been studied experimentally. A practical method is proposed with only three measurement procedures. With the consideration of indium (In) composition and blue shift, the method has a high applicability, which is practical for the LED chips vary from blue to green chips under different currents, including the packaged chips. On the other hand, according to the experimental and derived results, the junction-temperature difference and peak-wavelength shift in both blue-shift and red-shift fields show similar parabolic-like relations. To simplify the experimental processes, dual-wavelength LEDs were fabricated and measured instead of conventional single-wavelength LEDs.