Auger decay and the direct double ionization probability of a 2p inner-shell hole in a singly charged Ar+ ion
Auger decay and the direct double ionization probability of a 2p inner-shell hole in a singly charged Ar+ ion
复制标题
单电荷 Ar 离子中 2p 内壳孔的俄歇衰变和直接双电离概率
DOI:
10.1140/epjd/e2014-50124-5
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发表时间:
2014
影响因子:
1.8
通讯作者:
Yuan Jianmin
中科院分区:
文献类型:
--
作者:
Liu Pengfei;Liu Yanpeng;Zeng Jiaolong;Yuan Jianmin
Single and double Auger decay processes of Ar+2p−1hole levels belonging to the configurations of 2p53s23p5and 2p53s3p6are investigated in the framework of perturbation theory implemented by the distorted wave approximation. The single Auger decay channels and rates are determined and the predicted total rates can differ by more than an order of magnitude for the levels of 2p53s23p5, yet they are very close for levels belonging to 2p53s3p6. By combining the double photoionization cross sections of the neutral species, our theoretical Auger spectra of the single Auger decay process nicely interpreted a recent experiment [S.M. Huttula et al., Phys. Rev. Lett.110, 113002 (2013)]. A configuration averaged branching ratio of 6.5% and 7.3% are predicted for the direct double Auger decay to the total probability for 2p53s23p5and 2p53s3p6, respectively, which is smaller than that of Ar 2p−1hole states.