The Positron Probe Microanalyser Studies of Defect Distribution Induced by Machining of Copper, Iron and Titanium
The Positron Probe Microanalyser Studies of Defect Distribution Induced by Machining of Copper, Iron and Titanium
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DOI：
10.1007/s11249-015-0587-1
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发表时间：
2015-10-01
影响因子：
3.2
通讯作者：
Pachla, Waclaw
中科院分区：
文献类型：
--
作者：
Dryzek, Jerzy;Nojiri, Shigehiro;Pachla, Waclaw
我们展示了新的实验技术的应用：正电子探针微分析仪在铣削引起的缺陷轮廓的研究。在铣床上以不同的切削速度加工铜、铁和钛金属箔。该技术揭示了在加工表面下的缺陷轮廓，其延伸到数百微米。轮廓的大小取决于金属和切削速度。正电子探针微分析仪使我们能够跟踪在不同温度下退火后轮廓的演变。令人惊讶的是，在加工表面附近检测到几十微米厚层的高热稳定性。
We demonstrate the application of the new experimental technique: positron probe microanalyser for studies of the defect profiles induced by milling. Metal foils of Cu, Fe and Ti were subjected to machining in a milling machine with different cutting speed. This technique revealed well-defined profiles of defects below the machined surface which was extended up to hundreds of micrometres. The extent of the profile depended on the metal and the cutting speed. The positron probe microanalyser allowed us to trace the evolution of the profile after annealing in different temperatures. Surprisingly, the high thermal stability of a few tens of micrometres thick layer adjacent to the machined surface was detected.