Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence
Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence
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DOI：
10.1088/0957-0233/25/1/015502
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发表时间：
2013
影响因子：
2.4
通讯作者：
K. Sperlich;H. Stolz
中科院分区：
文献类型：
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作者：
K. Sperlich;H. Stolz
如今，每个光学实验室都可以找到CCD相机，用于各种不同的目的。定量测量光谱相关强度意味着必须考虑光谱量子效率（SQE），至少在光谱宽度超过几纳米的情况下是这样。SQE的确定通常被认为是一个繁琐的挑战，结果相当不准确。然而，我们在本文中表明，校准的光电二极管，这已成为一个负担得起的和简单的任务。在本文中，我们研究了一个正面和五个背照式电子倍增CCD相机从Andor技术在350-1080 nm的光谱分辨率高达1 nm的范围内的SQE。SQE的温度依赖性已经在上面给出的+20 ° C和−80 °C之间的光谱区间内进行了研究。我们观察到意外的振荡，在SQE的前照明相机。对于具有紫外转换层的背照式相机，测量的SQE与制造商的数据非常不同，制造商的数据来自转换层的透射光谱。对于没有转换层的传统背照式相机，我们在温度依赖性测量中观察到有趣的交叉行为。
Nowadays, CCD cameras can be found in every optical laboratory for highly diverse purposes. Measuring quantitatively spectral-dependent intensities implies that the spectral quantum efficiency (SQE) has to be taken into account, at least if the width of the spectrum is more than a few nm. The determination of the SQE is usually considered to be a tedious challenge with rather inaccurate results. However, we show in this paper that with calibrated photo diodes, this has become an affordable and straightforward task. In this paper, we examined the SQE of one front- and five back-illuminated electron multiplying CCD cameras from Andor Technology in the range of 350–1080 nm with a spectral resolution of up to 1 nm. The temperature dependence of the SQE has been investigated in the spectral interval given above between +20 and −80 °C. We observed unexpected oscillations in the SQE for the front-illuminated camera. For back-illuminated cameras with an ultraviolet conversion layer, the measured SQE turns out to be very different from the manufacturer data, which results from the transmittance spectrum of the conversion layer. For conventional back-illuminated cameras without a conversion layer, we observed interesting crossing behavior in the temperature-dependent measurements.