Structure, morphology, and growth dynamics of perfluoro‐pentacene thin films
Structure, morphology, and growth dynamics of perfluoro‐pentacene thin films
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全氟并五苯薄膜的结构、形貌和生长动力学
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
F. Schreiber
中科院分区：
文献类型：
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作者：
S. Kowarik;A. Gerlach;A. Hinderhofer;S. Milita;F. Borgatti;F. Zontone;Toshiyasu Suzuki;F. Biscarini;F. Schreiber
我们报道了有机半导体全氟五苯（PFP）薄膜的高结构有序，PFP是n型应用的候选材料，通过真空升华沉积在氧化硅片上。在镜面和掠射入射几何和小于0.01°的嵌合度中，布拉格反射达到高阶，证明了良好的结构定义。薄膜完全由晶体组成，其结构接近体相，不受第二相的污染。实时X射线测量表明，PFP以stranski - krstanov生长模式生长，在第二层单层生长期间，在3d生长开始之前，第一层单层润湿衬底。讨论了其使用的意义。（©2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim）
We report high structural order in thin films of the organic semiconductor perfluoro‐pentacene (PFP), which is a candidate material for n‐type applications, deposited by vacuum sublimation on oxidized silicon wafers. Bragg reflections up to high order in both specular and grazing incidence geometries and a mosaicity of less than 0.01° demonstrate the well defined structure. The thin film entirely consists of crystallites with a structure close to the bulk phase without any contamination with a second phase. Real‐time X‐ray measurements show that PFP grows in a Stranski–Krastanov growth mode with the first monolayer wetting the substrate before 3d‐growth sets in during growth of the second monolayer. Implications for its use are discussed. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)