Explanation of the patterns in Mie theory

Explanation of the patterns in Mie theory
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DOI:
10.1016/j.jqsrt.2009.11.010
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发表时间:
2010-03-01
影响因子:
2.3
通讯作者:
Chakrabarti, A.
Chakrabarti, A.
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Berg, M. J.;Sorensen, C. M.;Chakrabarti, A.

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已知球形粒子的远场散射光强度或相关相位函数在用散射波矢量表示时会显示出整体幂律结构。根据经验确定的与颗粒尺寸和折射率相关的强度模式是已知的。然而,这些模式的原因尚未得到令人满意的解释。这项工作应用精确的微观物理模型来解释大多数模式,特别是揭示从一种幂律到另一种幂律交叉的物理原因。这种微观物理方法的一个独特方面是相量分析,它提供了一种基于视觉的方法来检查模型中涉及的角度相关小波叠加。简单的颜色编码方案将相量连接到粒子的内部。正是这种联系揭示了交叉的意义。 (C) 2009 Elsevier Ltd. 保留所有权利
The far-field scattered light intensity, or the related phase function, for a spherical particle is known to display an overall power-law structure when formulated in terms of the scattering wave vector. Empirically determined patterns in the intensity relating to the particle size and refractive index are known. The cause of the patterns, however, has not been satisfactorily explained. This work applies an exact microphysical model to explain most of the patterns, and specifically, to reveal the physical cause of crossovers from one power-law to another. A unique aspect of this microphysical approach is phasor analysis, which provides a visually based way to examine the angle-dependent wavelet superposition involved in the model A simple color coding scheme connects the phasors to the interior of the particle. and it is this connection that reveals the meaning of the crossovers. (C) 2009 Elsevier Ltd. All rights reserved