Au:Ga Alloyed Clusters to Enhance Al Contacts to P-type GaN

Au:Ga Alloyed Clusters to Enhance Al Contacts to P-type GaN
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Au:Ga 合金团簇可增强 Al 与 P 型 GaN 的接触

DOI:
10.1109/rapid.2018.8508914
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发表时间:
2018
期刊:
2018 IEEE Research and Applications of Photonics In Defense Conference (RAPID)
影响因子:
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通讯作者:
E. Kohn
E. Kohn
中科院分区:
--
文献类型:
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作者:
A. Klump;F. Kaess;B. Sarkar;R. Kirste;R. Collazo;P. Reddy;S. Mita;Z. Sitar;M. H. Breckenridge;E. Kohn

文献摘要

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p型GaN膜上的Au的沉积、退火和随后的去除降低了随后沉积的Al金属接触的电阻率。的减少被解释为形成的Au:Ga合金,从表面去除Ga,并创建围绕电活性合金簇的Ga空位。
Deposition, annealing, and subsequent removal of Au on p-type GaN films reduced the resistivity of subsequently deposited Al metal contacts. The reduction is explained by formation of Au:Ga alloys which remove Ga from the surface, and create Ga-vacancies that surround the electrically active alloy clusters.