STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films

STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
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DOI:
10.1016/j.susc.2007.08.009
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发表时间:
2007-11
期刊:
影响因子:
1.9
通讯作者:
T. Maffeis;D. Yung;L. LePennec;M. Penny;R. Cobley;E. Comini;G. Sberveglieri;S. Wilks
T. Maffeis;D. Yung;L. LePennec;M. Penny;R. Cobley;E. Comini;G. Sberveglieri;S. Wilks
中科院分区:
化学3区
文献类型:
--
作者:
T. Maffeis;D. Yung;L. LePennec;M. Penny;R. Cobley;E. Comini;G. Sberveglieri;S. Wilks

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