Faceting, reconstruction, and defect microstructure at ceramic surfaces revealed by atomic force microscopy
Faceting, reconstruction, and defect microstructure at ceramic surfaces revealed by atomic force microscopy
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原子力显微镜揭示陶瓷表面的刻面、重建和缺陷微观结构
DOI：
10.1116/1.577707
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发表时间：
1992
期刊：
影响因子：
--
通讯作者：
R. Lad
中科院分区：
文献类型：
--
作者：
M. Antonik;R. Lad
用原子力显微镜直接观察了几种单晶陶瓷在空气中解理和真空中处理后的表面微观结构和形貌。原子和/或多原子的高度台阶和原子平坦的平台上观察到解理Cr2 O3（1012）和NiO（100）表面和抛光和退火的Al 2 O3（1012）。在TiO 2的（110）、（100）和（001）表面上揭示了刻面、重构和Ar+离子诱导的损伤的实例。在VC 0.75（100）表面成像期间，头端退化和伪影明显。原子力显微镜的结果表明，丰富的纳米尺度的功能存在，即使在精心准备的单晶陶瓷表面。
Atomic force microscopy has been used to directly observe the surface microstructure and morphology of several single crystal ceramics which were either cleaved in air or processed in ultrahigh vacuum. Atomic and/or multiatomic height steps and atomically flat terraces were observed on cleaved Cr2O3 (1012) and NiO (100) surfaces and on polished and annealed Al2O3 (1012). Examples of faceting, reconstruction, and Ar+ ion induced damage were revealed on the (110), (100), and (001) surfaces of TiO2. Tip degradation and artifacts were evident during imaging of VC0.75 (100) surfaces. The atomic force microscopy results indicate that a wealth of nanometer scale features exists even on carefully prepared single crystal ceramic surfaces.