Near-Field Microwave Microscopy of Materials Properties
Near-Field Microwave Microscopy of Materials Properties
复制标题
材料特性的近场微波显微镜
DOI：
10.1007/978-94-010-0450-3_10
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
F. Wellstood
中科院分区：
文献类型：
--
作者：
S. Anlage;D. Steinhauer;B. J. Feenstra;C. P. Vlahacos;F. Wellstood
近场微波显微镜为一类新的材料电动力学实验创造了机会。摆脱了传统微波光学的限制，实验可以在很宽的频率范围内以高空间分辨率进行。此外，测量可以定量进行，以便可以创建微波材料特性的图像。我们回顾了近场微波显微镜的五种主要类型，并详细讨论了我们自己的显微镜形式。微波薄层电阻，介电常数和介电可调谐性的定量图像的介绍和讨论。对微波电动力学特性的近场测量的未来发展进行了展望。
Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broad frequency range. In addition, the measurements can be done quantitatively so that images of microwave materials properties can be created. We review the five major types of near-field microwave microscopes and discuss our own form of microscopy in detail. Quantitative images of microwave sheet resistance, dielectric constant, and dielectric tunability are presented and discussed. Future prospects for near-field measurements of microwave electrodynamic properties are also presented.