X-ray Interference Fringe in Bragg–(Bragg)m–Laue Case from Thin Finite Crystal
X-ray Interference Fringe in Bragg–(Bragg)m–Laue Case from Thin Finite Crystal
复制标题
薄有限晶体布拉格-(布拉格)米-劳厄情况下的 X 射线干涉条纹
DOI：
10.1143/jjap.44.l787
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发表时间：
2005
影响因子：
1.5
通讯作者：
T. Kawamura
中科院分区：
文献类型：
--
作者：
T. Fukamachi;R. Negishi;M. Yoshizawa;T. Kawamura
在吸收薄的有限晶体中，部分入射X射线可以被限制在Bragg-(Bragg)m-Laue盒中。被限制的光束在晶体中反复衍射，并从晶体的边缘表面出来。在反射方向和传输方向发射的光束中，观察到了由约束过程中顶面和底面之间的一系列衍射引起的X射线干涉条纹。研究了用同步辐射测量的条纹特征。
In an absorbing thin finite crystal, part of the incident X-rays can be confined in the Bragg–(Bragg)m–Laue case. The confined beams are repeatedly diffracted in the crystal and come out of its edge surface. An X-ray interference fringe, which is caused by a sequence of diffractions between the top and bottom surfaces during the confinement, is observed in the beams emitted in both the reflection and transmission directions. The characteristic features of the fringe measured using synchrotron radiation are studied.