Dielectric probe for scattering-type terahertz scanning near-field optical microscopy
Dielectric probe for scattering-type terahertz scanning near-field optical microscopy
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DOI：
10.1063/1.4824496
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发表时间：
2013-10
影响因子：
4
通讯作者：
T. Kurihara;K. Yamaguchi;Hiroshi Watanabe;M. Nakajima;T. Suemoto
中科院分区：
文献类型：
--
作者：
T. Kurihara;K. Yamaguchi;Hiroshi Watanabe;M. Nakajima;T. Suemoto
采用电介质材料作为散射型太赫兹扫描近场光学显微镜（THz S-SNOM）的探针材料。有人发现，介电探针表现出一个强的近场散射信号的振幅与金属探针。用时域有限差分法计算了探针尖端附近的电场，结果表明，探针尖端附近的电场增强与金属探针的电场增强相当。与金属探针的响应相比，电介质探针还表现出更快的时间响应。非金属探针的引入将扩大THz超近场光学显微镜技术的应用领域。
Dielectric material was used as the probe material for a scattering-type terahertz scanning near-field optical microscope (THz S-SNOM). It was found that the dielectric probe exhibits a strong near-field scattering signal with an amplitude comparable to that of the metallic probe. The behavior of the electric near-field around the tip was calculated using the finite-difference time-domain method, showing the field enhancement comparable to that of the metallic probe. The dielectric probe also exhibited a faster temporal response compared to the response of the metallic probe. Introduction of a non-metallic probe would enlarge the application field of the THz S-SNOM technique.