Charging behavior in no-insulation REBCO pancake coils

Charging behavior in no-insulation REBCO pancake coils
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无绝缘 REBCO 扁平线圈的充电行为

DOI:
10.1109/tasc.2014.2365623
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发表时间:
2015
影响因子:
1.8
通讯作者:
So Noguchi
So Noguchi
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Xudong Wang;Tao Wang;Erika Nakada;Atsushi Ishiyama;Ryusei Itoh;So Noguchi

文献摘要

相似文献

高温超导线圈的稳定裕度比低温超导线圈的稳定裕度大两到三个数量级。近年来,许多论文已经报道了具有极大增强的热稳定性的匝间无绝缘(NI)HTS线圈的测试结果,使得即使在超过临界电流的2.5倍的操作电流下,在NI线圈中也不会发生烧毁。因此,本文的主要目标是阐明NI REBCO线圈的瞬态电磁和热行为以及高热稳定性的机理。提出了一种用于NI REBCO线圈数值模拟的部分元件等效电路(PEEC)模型,该模型考虑了线圈匝间的局部接触电阻、REBCO带的I-V特性以及NI REBCO线圈的局部自感和互感。使用PEEC模型,我们研究了匝间接触电阻对NI REBCO线圈在突然放电过程中的瞬态行为的影响。我们还使用PEEC模型进行热传导分析,以阐明NI REBCO线圈在过流操作期间的瞬态行为。
Stability margin of a high-temperature superconducting (HTS) coil is two or three orders of magnitude greater than that of a low-temperature superconducting coil. In recent years, many papers have reported test results of turn-to-turn no-insulation (NI) HTS coils having extremely enhanced thermal stability, such that burnout never occurs in an NI coil, even at an operating current exceeding 2.5 times the critical current. Thus, The main goal of this paper is to clarify transient electromagnetic and thermal behaviors and mechanism of the high thermal stability in an NI REBCO coil. A partial element equivalent circuit (PEEC) model is proposed for the numerical simulation of an NI REBCO coil, which considers a local electrical contact resistance between turns, an I-V characteristic of an REBCO tape, and local self and mutual inductances of the NI REBCO coil. Using the PEEC model, we investigate the influence of the turn-to-turn contact resistance on the transient behavior of the NI REBCO coil during sudden discharging. We also perform thermal conduction analyses with the PEEC model to clarify the transient behavior of an NI REBCO coil during an overcurrent operation.